Modeling and Characterization of RF and Microwave Power FETs: Characterization and Modeling of LDMOS and III-V Devices (The Cambridge RF and Microwave Engineering Series)
Cambridge University Press
Edition: First Edition, 6/25/2007
EAN 9780521870665, ISBN10: 0521870666
Hardcover, 380 pages, 24.7 x 17.4 x 2.2 cm
Language: English
This book is a comprehensive exposition of FET modeling, and is a must-have resource for seasoned professionals and new graduates in the RF and microwave power amplifier design and modeling community. In it, you will find descriptions of characterization and measurement techniques, analysis methods, and the simulator implementation, model verification and validation procedures that are needed to produce a transistor model that can be used with confidence by the circuit designer. Written by semiconductor industry professionals with many years' device modeling experience in LDMOS and III-V technologies, this was the first book to address the modeling requirements specific to high-power RF transistors. A technology-independent approach is described, addressing thermal effects, scaling issues, nonlinear modeling, and in-package matching networks. These are illustrated using the current market-leading high-power RF technology, LDMOS, as well as with III-V power devices.
1. RF and microwave power transistors
2. An introduction to the compact modeling of high power FETs
3. Electrical measurement techniques
4. Passive components
simulation and modeling
5. Thermal characterization and modeling
6. Modeling the active transistor
7. Function approximation for compact modeling
8. Model implementation in CAD tools
9. Model validation
About the authors
Index.
'...a well-written and useful text. ...a coherent review of the advanced state of power FET modelling and characterisation.' IEEE microwave magazine