Defect and Impurity Engineered Semiconductors and Devices: Volume 378 (MRS Proceedings)

Defect and Impurity Engineered Semiconductors and Devices: Volume 378 (MRS Proceedings)

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Materials Research Society, 1995-10-16
EAN 9781558992818, ISBN10: 1558992812

Paperback, 1082 pages, 23.7 x 16 x 6.2 cm