Electron Microprobe Analysis and Scanning Electron Microscopy in Geology
Cambridge University Press
Edition: 2, 6/10/2010
EAN 9780521142304, ISBN10: 052114230X
Paperback, 212 pages, 24.4 x 17 x 1 cm
Language: English
Originally published in English
Originally published in 2005, this book covers the closely related techniques of electron microprobe analysis (EMPA) and scanning electron microscopy (SEM) specifically from a geological viewpoint. Topics discussed include: principles of electron-target interactions, electron beam instrumentation, X-ray spectrometry, general principles of SEM image formation, production of X-ray 'maps' showing elemental distributions, procedures for qualitative and quantitative X-ray analysis (both energy-dispersive and wavelength-dispersive), the use of both 'true' electron microprobes and SEMs fitted with X-ray spectrometers, and practical matters such as sample preparation and treatment of results. Throughout, there is an emphasis on geological aspects not mentioned in similar books aimed at a more general readership. The book avoids unnecessary technical detail in order to be easily accessible, and forms a comprehensive text on EMPA and SEM for geological postgraduate and postdoctoral researchers, as well as those working in industrial laboratories.
Preface
Acknowledgements
1. Introduction
2. Electron-specimen interactions
3. Instrumentation
4. Scanning electron microscopy
5. X-ray spectrometers
6. Element mapping
7. X-ray analysis (1)
8. X-ray analysis (2)
9. Sample preparation
Appendix
References
Index.
Review of the hardback: 'The subject is treated in a clear and logical fashion ... Dr Reed has produced an excellent and thoroughly readable book ... highly recommended for all those who use the electron microprobe.' Allan Pring, Geological Magazine