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Measurement Techniques for Radio Frequency Nanoelectronics (The Cambridge RF and Microwave Engineering Series)

Measurement Techniques for Radio Frequency Nanoelectronics (The Cambridge RF and Microwave Engineering Series)

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T. Mitch Wallis, Pavel Kabos
Cambridge University Press, 2017-09-14
EAN 9781107120686, ISBN10: 1107120683

Hardcover, 328 pages, 25.4 x 17.8 x 1.8 cm
Language: English