Modern RF and Microwave Measurement Techniques (The Cambridge RF and Microwave Engineering Series)

Cambridge University Press, 6/20/2013
EAN 9781107036413, ISBN10: 1107036410

Hardcover, 474 pages, 25 x 17.6 x 3.2 cm
Language: English

This comprehensive, hands-on review of the most up-to-date techniques in RF and microwave measurement combines microwave circuit theory and metrology, in-depth analysis of advanced modern instrumentation, methods and systems, and practical advice for professional RF and microwave engineers and researchers. Topics covered include microwave instrumentation, such as network analyzers, real-time spectrum analyzers and microwave synthesizers; linear measurements, such as VNA calibrations, noise figure measurements, time domain reflectometry and multiport measurements; and non-linear measurements, such as load- and source-pull techniques, broadband signal measurements, and non-linear NVAs. Each technique is discussed in detail and accompanied by state-of-the-art solutions to the unique technical challenges associated with its use. With each chapter written by internationally recognised experts in the field, this is an invaluable resource for researchers and professionals involved with microwave measurements.

Part I. General Concepts
1. Transmission lines and scattering parameters Roger Pollard and Mohamed Sayed
2. Microwave interconnections, probing, and fixturing Leonard Hayden
Part II. Microwave Instrumentation
3. Microwave synthesizers Alexander Chenakin
4. Real-time spectrum analysis and time-correlated measurements applied to non-linear system characterization Marcus Da Silva
5. Vector network analyzers Mohamed Sayed and Jon Martens
6. Microwave power measurements Ronald Ginley
7. Modular systems for RF and microwave measurements Jin Bains
Part III. Linear Measurements
8. Two-port network analyzer calibration Andrea Ferrero
9. Multiport and differential S-parameter measurements Valeria Teppati and Andrea Ferrero
10. Noise figure characterization Nerea Otegi, Juan-Mari Collantes and Mohamed Sayed
11. TDR based S-parameters Peter J. Pupalaikis and Kaviyesh Doshi
Part IV. Non-Linear Measurements
12. Vector network analysis for nonlinear systems Yves Rolain, Gerd Vandersteen and Maarten Schoukens
13. Load and source-pull techniques Valeria Teppati, Andrea Ferrero and Gian Luigi Madonna
14. Broadband signal measurements for linearity optimization Marco Spirito and Mauro Marchetti
15. Pulse and RF measurement Anthony Parker.